Shaping the reflection near-field optical probe: finite domain time difference modelling and fabrication using a focused ion beam

An optical fibre ending in a trihedral tip is proposed as a convenient prob e for reflection near-field optical microscopy in emission/collection mode. Its shape is obtained by ion milling. A first example of manufacturing and numerical models using the bi-dimensional FDTD method is presented. It con firms the strong influence of the facet angle on the intensity reflected by the probe, which is predicted by a rough analysis. This method can help us to optimize the 'reflection probe' by reducing this offset signal.