A. Medvid et al., MECHANISM OF RECORDING AND ERASING OF OPTICAL INFORMATION BY LASER-RADIATION ON SIO2-(CO-SIO2-SI MULTILAYER STRUCTURE(SI)), Applied surface science, 115(4), 1997, pp. 393-398
Citations number
12
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
The optical properties of SiO2-(Co + Si)-SiO2-Si structures studied by
treatment with Q-switched YAG:Nd and CO2 lasers are presented. The ph
oto-thermo-chemical reaction of Co with Si has a threshold character.
No change in optical properties of (Co + Si) mixture was observed up t
o 2 MW/cm(2) intensities of CO2 laser radiation. A decrease of the ref
lection coefficient R (at lambda = 663 nm) from 70% to 45% is observed
as the intensity is increased up to 8 MW/cm(2). When this multilayer
structure is subject to Q-switched YAG:Nd laser radiation of an intens
ity from 14 MW/cm(2) to 53 MW/cm(2), the magnitude of the reflection c
oefficient returns to its initial value of 70%. It means that informat
ion recorded by the CO2 laser is erased. Calculations of the temperatu
re field during irradiation with CO2 and YAG:Nd laser showed that the
phase transition from mixture (Co + Si) to CoSi2 caused by CO2 laser i
rradiation results in recording of information, whereas the thermal im
pact caused by YAG:Nd laser irradiation results in amorphization of Co
Si2 and erasing of information. (C) 1997 Elsevier Science B.V.