Microstructure of rapidly solidified Al-20Si alloy powders

Authors
Kim, TS Lee, BT Lee, CR Chun, BS
Citation
Ts. Kim et al., Microstructure of rapidly solidified Al-20Si alloy powders, MAT SCI E A, 304, 2001, pp. 617-620
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
ISSN journal
09215093 → ACNP
Volume
304
Year of publication
2001
Pages
617 - 620
Database
ISI
SICI code
0921-5093(20010531)304:<617:MORSAA>2.0.ZU;2-B
Abstract
Microstructural details of rapidly solidified Al-20Si alloy powders by gas atomization were examined by transmission electron microscope. The as-atomi zed alloy powder consists of primary and eutectic Si embedded in Al matrix. Typical sizes of Al grain, primary Si and eutectic Si measured in the powd er of 40 mum in diameter are 1 mum, 3 mum and 100 nm, respectively. Twin an d stacking faults were found to present in the precipitated Si. The alloy p owder has semicoherently bonded interface between Al {111} and Si {111} wit h a specific lattice spacing. (C) 2001 Elsevier Science B.V. All rights res erved.