In situ electrical resistivity was measured around glass transition tempera
ture in a Pd40Cu30Ni10P20 glassy metal. The glassy sample was first heated
beyond the eutectic temperature T-m = 804K after crystallization and melted
at 973 Ii completely. Then, the melt was cooled to room temperature. In th
e solidification process. the crystallization was suppressed and the change
in the electrical resistivity associated with glass transition was measure
d for the cooling process. In the temperature range between room temperatur
e and 650 K in the supercooled liquid region, the behavior of the electrica
l resistivity was in a good agreement for the heating and the cooling proce
sses. This suggests that the variation of the electrical resistivity around
glass transition temperature is an inherent physical phenomenon rather tha
n the nano-crystallization or the amorphous phase separation. (C) 2001 Else
vier Science B.V. All rights reserved.