RAMAN-SPECTROSCOPY AS A MAPPING TOOL FOR LOCALIZED STRAIN IN MICROENGINEERED STRUCTURES

Citation
D. Wood et al., RAMAN-SPECTROSCOPY AS A MAPPING TOOL FOR LOCALIZED STRAIN IN MICROENGINEERED STRUCTURES, Journal of materials science letters, 16(14), 1997, pp. 1222-1223
Citations number
4
Categorie Soggetti
Material Science
ISSN journal
02618028
Volume
16
Issue
14
Year of publication
1997
Pages
1222 - 1223
Database
ISI
SICI code
0261-8028(1997)16:14<1222:RAAMTF>2.0.ZU;2-6