A method is presented for calculating near-field images of nanoobjects from
the intensity distributions measured using the scanning near-field optical
microscopy technique. The method is based on a formally exact solution of
the self-consistent local-field equation, which was derived using the diagr
am technique for summation of infinite series. It is shown that the self-co
nsistent fields calculated with and without considering the dielectric subs
trate differ significantly. Near-field images of simple geometric objects-p
arallelepipeds with various side ratios-are calculated. (C) 2001 MAIK "Nauk
a/Interperiodica".