Biexciton states in semiconductor microcavities - art. no. 165311

A planar semiconductor microcavity in the strong coupling regime has been s tudied by spectrally resolved degenerate four wave mixing using femtosecond laser pulses. At high excitation densities, new spectral features observed besides the cavity polaritons can be uniquely identified as of biexcitonic origin. We investigate the dispersion of these features with cavity detuni ng. The observations are compared to several model descriptions for the int eraction of the biexciton with the cavity light field.