Phase transformation kinetics induced in thin sol-gel PZT films under thermal annealing

Citation
Vy. Shur et al., Phase transformation kinetics induced in thin sol-gel PZT films under thermal annealing, PHYS SOL ST, 43(5), 2001, pp. 902-907
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICS OF THE SOLID STATE
ISSN journal
10637834 → ACNP
Volume
43
Issue
5
Year of publication
2001
Pages
902 - 907
Database
ISI
SICI code
1063-7834(2001)43:5<902:PTKIIT>2.0.ZU;2-D
Abstract
The surface morphology evolution and phase transformation kinetics in thin lead zirconate-titanate (PZT) sol-gel films during rapid thermal annealing were studied by in situ measurement of scattered light intensity and by rec ording successive instantaneous optical microscope images. We also studied the variation of the texture perfection, the fraction of the growing phase, and the angular dependence of the scattered intensity in partially anneale d samples. The parameters characterizing the kinetics of the pyrochlore-per ovskite phase transformation were derived by a mathematical treatment of th e experimental data. The phase transformation kinetics and the film crystal line texture are shown to depend substantially on the pyrolysis temperature . The texture formation mechanism is considered. (C) 2001 MAIK "Nauka/Inter periodica".