Y. Tomita et al., Copper bump bonding with electroless metal cap on 3 dimensional stacked structure, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 286-291
CBB, the copper bump bonding process could perform the flip-chip bonding in
100 mum pitch with electroless metal cap on the surface, leading to the in
terconnections of the copper through-hole electrodes on 3 dimensional stack
ed structure.
In this paper, the results of the technical studies on the both of the elec
troless plating process and the thermo-compressive bonding are introduced,
which are the key technologies for the interconnections expand to the inter
connections in 20 mum pitch to realize the advanced 3D stacked structure.