Temperature sensors placement strategy for fault diagnosis in integrated circuits

Authors
Bratek, P Kos, A
Citation
P. Bratek et A. Kos, Temperature sensors placement strategy for fault diagnosis in integrated circuits, P IEEE SEM, 2001, pp. 245-251
Citations number
8
Categorie Soggetti
Current Book Contents
Journal title
SEVENTEENTH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM, PROCEEDINGS 2001 → ACNP
ISSN journal
10652221
Year of publication
2001
Pages
245 - 251
Database
ISI
SICI code
1065-2221(2001):<245:TSPSFF>2.0.ZU;2-E
Abstract
In this paper we present a new method of temperature sensor placement strat egy. This placement method is proposed for fault diagnosis in Integrated Ci rcuits (ICs). Simulation results of new concept of the sensors placement strategy are pre sented. Statistical analyses of the yield of the testing method are shown.