Citation
N. Huber et al., Chemical composition and charge stability of highly crystalline pulsed-laser-deposited polytetrafluoroethylene films on metal substrates, APPL PHYS A, 72(5), 2001, pp. 581-585
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
ISSN journal
09478396
→ ACNP
Volume
72
Issue
5
Year of publication
2001
Pages
581 - 585
Database
ISI
SICI code
0947-8396(200105)72:5<581:CCACSO>2.0.ZU;2-E
Abstract
KrF excimer-laser ablation of sintered-powder polytetrafluoroethylene (PTFE
) targets is used for the deposition of high-quality PTFE films on metallic
microstructures and metal backplates for electroacoustic applications. The
films are found to be highly crystalline, consisting of large spherulites
with diameters up to 1 mm. X-ray photoelectron spectroscopy of the films re
vealed the chemical similarity of press-sinter target pulsed-laser-deposite
d films with bulk PTFE. Negatively charged PTFE films on stainless steel ba
ckplates exhibit an exceptional charge stability with practically no decrea
se of the surface potential up to 225 degreesC in open-circuit thermally st
imulated discharge.