Three-dimensionally controlled size-reduction of silicon nanopillars by photoelectrochemical etching

Citation
R. Juhasz et J. Linnros, Three-dimensionally controlled size-reduction of silicon nanopillars by photoelectrochemical etching, APPL PHYS L, 78(20), 2001, pp. 3118-3120
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
20
Year of publication
2001
Pages
3118 - 3120
Database
ISI
SICI code
0003-6951(20010514)78:20<3118:TCSOSN>2.0.ZU;2-Y
Abstract
Silicon nanopillars, fabricated by electron beam lithography and reactive i on etching, were size-reduced using laser-assisted electrochemical etching in a dilute hydrofluoric acid solution. The progressing size reduction was followed by scanning electron microscopy down to final diameters of similar to 15 nm. By varying the voltage bias, it was found that etching could be directed primarily at the pillar top (7 V) or at the pillar base (-0.6 V) w hereas in an intermediate regime, conformal etching could be obtained. From the rate of volume change during etching, it was concluded that holes, par ticipating in the dissolution reaction, were primarily generated within the pillar volume. The corresponding effective dissolution valence was similar to5-9, indicating substantial recombination losses within the pillar. (C) 2001 American Institute of Physics.