R. Juhasz et J. Linnros, Three-dimensionally controlled size-reduction of silicon nanopillars by photoelectrochemical etching, APPL PHYS L, 78(20), 2001, pp. 3118-3120
Silicon nanopillars, fabricated by electron beam lithography and reactive i
on etching, were size-reduced using laser-assisted electrochemical etching
in a dilute hydrofluoric acid solution. The progressing size reduction was
followed by scanning electron microscopy down to final diameters of similar
to 15 nm. By varying the voltage bias, it was found that etching could be
directed primarily at the pillar top (7 V) or at the pillar base (-0.6 V) w
hereas in an intermediate regime, conformal etching could be obtained. From
the rate of volume change during etching, it was concluded that holes, par
ticipating in the dissolution reaction, were primarily generated within the
pillar volume. The corresponding effective dissolution valence was similar
to5-9, indicating substantial recombination losses within the pillar. (C)
2001 American Institute of Physics.