Charging of single Si nanocrystals by atomic force microscopy

Conducting-tip atomic force microscopy (AFM) has been used to electronicall y probe silicon nanocrystals on an insulating substrate. The nanocrystal sa mples were produced by aerosol techniques and size classified; nanocrystal size can be controlled in the size range of 2-50 nm with a size variation o f less than 10%. Using a conducting tip, the charge was injected directly i nto the nanocrystals, and the subsequent dissipation of the charge was moni tored. Estimates of the injected charge can be made by comparison of the da ta with an intermittent contact mode model of the AFM response to the elect rostatic force produced by the stored charge. (C) 2001 American Institute o f Physics.