A new technique for measuring third-order susceptibility with a Mach-Zehnde
r interferometer with a pump-probe system is proposed. The optical setup is
combined with a charge-coupled device for image processing. With the propo
sed method it is possible to resolve the spatial profile of a complex nonli
near variation index with only one laser shot in the nonlinear material. Th
erefore we can get intensity-resolved information by comparing this profile
, pixel per pixel, with that of the incident beam. To verify the validity o
f the method, we carry out measurements of reference materials illuminated
by linearly polarized light. Good agreement is obtained with measurements m
ade by various authors. An advantage of this new technique is that only one
laser shot is needed to minimize the risk of damage in fragile nonlinear m
aterials. (C) 2001 Optical Society of America.