Propagation characteristics of Schottky-contact slow-wave microstrip line

The present paper computes the normalized phase constant, dielectric loss, and conductor loss of the voltage-controlled Schottky-contact microstrip li ne using the variational method based on the single-layer reduction (SLR) f ormulation. Results computed by the SLR formulation show very good agreemen t with the experimental results, both in the normalized phase constant and total losses with 2.0% and 0.01 dB / mm, respectively. The present formulat ion can also handle a greater number of dielectric layers. The model is sui table for tile CAD of Schottky-contact microstrip structures. (C) 2001 John Wiley & Sons. Inc.