Error analysis for measurements of microwave surface resistance of high-temperature superconductors by dielectric resonator method

In this paper the relations between the errors in measurements for the micr owave surface resistance of a high-temperature superconducting thin film an d the geometry and frequency of a parallel plate dielectric resonator were analyzed. The results showed that the influence of the 2a/L(ratio of the di ameter of the dielectric rod to its length), the b/a (ratio of the radius o f the metal cavity to the radius of the dielectric rod) and the frequency f on the error and the measurable minimum surface resistance R-smin is quite important. The curves obtained in this paper could be used to design the d ielectric resonators of parallel plate type. The error of order of 1% and R -smin of the order of micro-ohm could be obtained by proper choosing 2a/L, b/a and f.