Structural transition in organic thin films for nanometer scale data recording

Citation
Dx. Shi et al., Structural transition in organic thin films for nanometer scale data recording, ACT PHY C E, 50(5), 2001, pp. 990-993
Citations number
20
Categorie Soggetti
Physics
Journal title
ACTA PHYSICA SINICA
ISSN journal
10003290 → ACNP
Volume
50
Issue
5
Year of publication
2001
Pages
990 - 993
Database
ISI
SICI code
1000-3290(200105)50:5<990:STIOTF>2.0.ZU;2-4
Abstract
Nanometer scale data recording has been achieved on p-nitrobenzonitrile thi n films using scanning tunneling microscopy. When a series of voltage pulse is applied between the STM tip and the highly ordered pyrolytic graphite s ubstrate, structural transition at molecular scale has been observed direct ly for PNBN thin films. The recording mechanism is attributed to local stru ctural transition at molecular scale, i.e., from a crystalline state to a d isordered one. The former corresponds to a high electrical resistance,and t he latter to a low resistance.