Thermal diffusivity measurement of high-conducting solids by the method oftransient gratings

The recent results are represented on the transient thermal gratings (TTG) method development and applications for thermal diffusivity measurement of solids within interval from 10(-4) to 12.10(-4) m(2)/s that is attainable b y restricted scope of materials such as monocrystalline diamond, cubic boro n nitride, metals and so on. In the framework of one-dimensional model of h eat transfer the problem of precise measurements of bull; and semiinfinite samples is considered. Despite that only two parameters have to be determin ed when thermal diffusivity of real sample is measured, there are several f actors that give rise to the errors increase. The procedure of lifetime of thermal grating measuring appears to be the most significant sourer of inac curacy of thermal diffusivity determination. The approaches and equipment a re suggested which ensure the measurements to be reliable enough. With the grating constant Lambda to be varied from 40.10(-6) to 120.10(-6) m and pul se response function width of light detecting system being as large as 25.1 0(-9) s the relative error of measurements does not exceed 5-8%. The diamon d thermal diffusivity reference samples at range from 4.10(-4) to 9.10(-4) m(2)/s are manufactured by the certified laser thermorelaxmeter.