Combined photothermal and photoacoustic characterization of silicon-epoxy,and the existence of a particle percolation threshold.

Citation
Pj. Mendoza et al., Combined photothermal and photoacoustic characterization of silicon-epoxy,and the existence of a particle percolation threshold., ANAL SCI, 17, 2001, pp. S269-S272
Citations number
13
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYTICAL SCIENCES
ISSN journal
09106340 → ACNP
Volume
17
Year of publication
2001
Pages
S269 - S272
Database
ISI
SICI code
0910-6340(2001)17:<S269:CPAPCO>2.0.ZU;2-P
Abstract
Photoacoustic and Photothermal Radiometric detection were used to determine the thermal properties of silicon-epoxy composite materials in the volume range of 0 < x < 32 vol. % (50 mum). Photoacoustic detection was used to st udy the evolution of the thermal diffusivity as a function of the Si volume fraction, and PTR was used to determine the role of the electronic carrier s in thermal transport by taking the optical properties into consideration. The combined PA and PTR measurements show that there exists no linear rela tion between thermal diffusivity and silicon volume fraction. The thermal d iffusivity and optical absorption coefficient measurements can be obtained by means of combined photoacoustic and photothermal radiometric probes. Bot h parameters exhibit anomalous behavior in the 16 % Si volume fraction rang e, corroborating the existence of an electrical particle percolation thresh old for the three dimensional random close-packed solids.