Gy. Shen et al., Melting of indium at high pressure determined by monochromatic x-ray diffraction in an externally-heated diamond anvil cell, APPL PHYS L, 78(21), 2001, pp. 3208-3210
The melting behavior of indium at high pressure has been studied in an exte
rnally heated diamond anvil cell (DAC) using x-ray diffraction measurements
. Melting at high pressure was identified by the appearance of diffuse scat
tering from the melt with the simultaneous disappearance of crystalline dif
fraction signals. The observed melting curve is in good agreement with prev
ious determinations based on resistivity measurements in a piston cylinder
apparatus. These results demonstrate the successful melting experiments in
a DAC using the x-ray diffuse scattering as the melting criterion. (C) 2001
American Institute of Physics.