Fabrication of GaN suspended microstructures

Citation
Rp. Strittmatter et al., Fabrication of GaN suspended microstructures, APPL PHYS L, 78(21), 2001, pp. 3226-3228
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
21
Year of publication
2001
Pages
3226 - 3228
Database
ISI
SICI code
0003-6951(20010521)78:21<3226:FOGSM>2.0.ZU;2-I
Abstract
We report on a versatile processing technology for the fabrication of micro -electromechanical systems in gallium nitride (GaN). This technology, which is an extension of photo-electrochemical etching, allows for the controlle d and rapid undercutting of p-GaN epilayers. The control is achieved throug h the use of opaque metal masks to prevent etching in designated areas, whi le the high lateral etch rates are achieved by biasing the sample relative to the solution. For GaN microchannel structures processed in this way, und ercutting rates in excess of 30 mum/min have been attained. We propose two mechanisms to account for these high etch rates. (C) 2001 American Institut e of Physics.