High peak-to-valley ratios observed in InAs/InP resonant tunneling quantumdot stacks

Citation
M. Borgstrom et al., High peak-to-valley ratios observed in InAs/InP resonant tunneling quantumdot stacks, APPL PHYS L, 78(21), 2001, pp. 3232-3234
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
21
Year of publication
2001
Pages
3232 - 3234
Database
ISI
SICI code
0003-6951(20010521)78:21<3232:HPROII>2.0.ZU;2-0
Abstract
Resonant tunneling was observed through single InAs quantum dot (QD) stacks embedded in InP barriers with peak-to-valley ratios as high as 85 at 7 K. Negative differential resistance in the current-voltage [I(V)] characterist ics was obtained up to a point above the temperature of liquid nitrogen. Th ese features were observed in measurements on low-density QD stacks, in whi ch a macroscopic ohmic contact covered less than 150 QD stacks. Due to the design of the structure, the upper QD in the stack has the function of a ze ro-dimensional emitter. Electrons easily fill the upper dot, whereas tunnel ing through the entire structure is only allowed when two states in the dot s align energetically, resulting in sharp resonant tunneling peaks with hig h peak-to-valley ratios. (C) 2001 American Institute of Physics.