Variation of the grand mean value of Si-O distances in metamorphic reactions

Authors
Ye, DN Li, Z He, W
Citation
Dn. Ye et al., Variation of the grand mean value of Si-O distances in metamorphic reactions, CHIN SCI B, 46(8), 2001, pp. 702-704
Citations number
9
Categorie Soggetti
Multidisciplinary
Journal title
CHINESE SCIENCE BULLETIN
ISSN journal
10016538 → ACNP
Volume
46
Issue
8
Year of publication
2001
Pages
702 - 704
Database
ISI
SICI code
1001-6538(200104)46:8<702:VOTGMV>2.0.ZU;2-7
Abstract
The grand mean values of Si-O distances in both the left and the right side s of 33 metamorphic reaction equations have been calculated on the basis of data of single crystal structural refinement analysis. The results showed that the grand mean value of Si-O distances tends to decrease at high tempe rature, whereas that tends to increase at high pressure during a metamorphi c reaction.