FIELD CHARACTERIZATION OF A D-SHAPED OPTICAL-FIBER USING SCANNING NEAR-FIELD OPTICAL MICROSCOPY

Authors
HUNTINGTON ST NUGENT KA ROBERTS A MULVANEY P LO KM
Citation
St. Huntington et al., FIELD CHARACTERIZATION OF A D-SHAPED OPTICAL-FIBER USING SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Journal of applied physics, 82(2), 1997, pp. 510-513
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
82
Issue
2
Year of publication
1997
Pages
510 - 513
Database
ISI
SICI code
0021-8979(1997)82:2<510:FCOADO>2.0.ZU;2-9
Abstract
Scanning near-field optical microscopy is used to measure the mode pro file and evanescent field of a Ge-doped D-shaped optical fiber. The st ructure of the fiber is determined by differential etching followed by an investigation of the resultant topography with an atomic force mic roscope. This information is then used to theoretically model the expe cted behavior of the fiber and it is shown that the theoretical result s are in excellent agreement with the experimentally observed field. ( C) 1997 American Institute of Physics.