Low-frequency glow discharge deposition of a silicon dioxide film onto thesurface of glass microspheres

Citation
Vm. Izgorodin et al., Low-frequency glow discharge deposition of a silicon dioxide film onto thesurface of glass microspheres, HIGH ENERG, 35(2), 2001, pp. 123-127
Citations number
9
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
HIGH ENERGY CHEMISTRY
ISSN journal
00181439 → ACNP
Volume
35
Issue
2
Year of publication
2001
Pages
123 - 127
Database
ISI
SICI code
0018-1439(200103/04)35:2<123:LGDDOA>2.0.ZU;2-D
Abstract
Laser fusion research demands microsized hollow shells with a large diamete r and a thick wall. Because these geometric parameters are difficult to pro vide by fabrication, the wall thickness was increased by deposition of a si licon dioxide film on the outer surface of glass microspheres. The film was obtained by decomposition of tetraethoxysilane vapor in a low-frequency di scharge plasma in mixtures with argon and oxygen. The thickness of coating was shown to be a linear function of the deposition lime and the consumptio n of the precursor organoelement compound. The composition of plasma-deposi ted layers was studied and their density and refractive index were determin ed. Elemental analysis data showed that the coating comprised silicon dioxi de with carbon and hydrogen impurities.