In this paper, we present a simple yet accurate conformal Finite Difference
Time Domain (FDTD) technique, which can be used to analyze curved dielectr
ic surfaces. Unlike the existing conformal techniques for handling dielectr
ics, the present approach utilizes the individual electric field component
along the edges of the cell, rather than requiring the calculation of its a
rea or volume, which is partially filled with a dielectric material. The ne
w technique shows good agreement with the results derived by Mode Matching
and analytical methods.