Electronic excitation temperature profiles in an air microwave plasma torch

Citation
Km. Green et al., Electronic excitation temperature profiles in an air microwave plasma torch, IEEE PLAS S, 29(2), 2001, pp. 399-406
Citations number
26
Categorie Soggetti
Physics
Journal title
IEEE TRANSACTIONS ON PLASMA SCIENCE
ISSN journal
00933813 → ACNP
Volume
29
Issue
2
Year of publication
2001
Part
2
Pages
399 - 406
Database
ISI
SICI code
0093-3813(200104)29:2<399:EETPIA>2.0.ZU;2-2
Abstract
A 0.9- to 1.5-kW 2.45-GHz atmospheric pressure air microwave plasma torch h as been operated efficiently with less than 1% reflected power. The plasma is sustained in a 28-mm internal diameter fused quartz tube, which penetrat es perpendicularly through the wide walls of a tapered and shorted WR-284 ( 72 x 17-mm cross section) waveguide. A study has been made of the effects o f power and airflow on the electronic excitation temperature, T-exc. Abel i nversion of radial profile chord averaged Fe I emission lines in the 370-37 7-nm range have been used to obtain localized profile measurements of T-exc inside the waveguide excitation region. In general, temperature profiles p eak on axis with no evidence of a skin effect in the large diameter (10-mm full width at half maximum emission intensity) plasmas. A maximum central T -exc of 6550 K +/- 350 K is observed at an airflow rate of 28 Ipm, When mai ntaining a constant flow rate of 14 Ipm, a 55% increase in microwave power from 0.9 to 1.4 kW causes a similar to 100% increase in plasma volume witho ut any noticeable effect on the central T,,, value. At a constant microwave power of 1.4 kW, an increase in total flow rate from 11 to 28 Ipm decrease s the volume of the plasma by similar to 25% and increases the central T-ex c by similar to 13%. The axially peaked temperature profiles are consistent with an electron density of similar to 10(13) cm(-3).