The size and location of silicon particles that grow in a pure silane, capa
citively coupled RF discharge, are measured by laser light scattering. The
discharge conditions were similar to those typically used to produce amorph
ous silicon devices, except the temperatures is 300 K, At early discharge t
ime, when the particles are small (D similar to 15 nm), they are located at
the middle of the discharge. The larger ones that occur at later discharge
times form a double layer nearer the electrodes. Surprisingly, the particl
es are not concentrated at the region of brightest discharge-light, which r
epresents the distribution of high-energy electrons. Yet as expected, the d
istribution of film deposition on the electrodes fits radical diffusion wit
h a source proportional to light intensity. It is also shown, by tilting th
e substrate, that a small gradient in plasma potential can have a major eff
ect on particle positions.