M. Borgstrom et al., Electron beam pre-patterning for site-control of self-assembled InAs quantum dots on InP surfaces, J ELEC MAT, 30(5), 2001, pp. 482-486
A site control technique for individual InAs quantum dots (QDs) formed by s
elf-assembling has been developed, using scanning electron microscope (SEM)
assisted nano-deposition and metal organic vapor phase epitaxy (MOVPE). In
a first step we characterize a device with randomly distributed InAs QDs o
n InP, using resonant tunneling and transmission electron microscopy (TEM).
Secondly, we use nano-scale deposits, created at the focal point, of the e
lectron beam on an InP based heterostructure, as "nano growth masks". Growt
h of a thin InP layer produces nano-holes above the deposits. The deposits
are removed by oxygen plasma etching. When InAs is supplied on this surface
, QDs are self-assembled at the hole sites, while no InAs dots are observed
in the flat surface region. A vertical single electron tunneling device is
proposed, using the developed technique.