A new coherent optical detection technique employing coherent frequency-dom
ain reflectometry and a novel optical frequency sensor is demonstrated for
high-precision optical path-length measurements. Using pulsed laser sources
, an improvement of more than two orders of magnitude in spatial resolution
over conventional optical coherent frequency domain reflectometry techniqu
es is demonstrated. Varying degrees of spatial resolution ranging from seve
ral centimeters to a few hundred nanometers are achieved, High-precision di
stance measurement with long baseline is also presented.