Relative secondary ion yields of polymers

Citation
X. Dong et Dm. Hercules, Relative secondary ion yields of polymers, J PHYS CH B, 105(18), 2001, pp. 3942-3949
Citations number
32
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
105
Issue
18
Year of publication
2001
Pages
3942 - 3949
Database
ISI
SICI code
1520-6106(20010510)105:18<3942:RSIYOP>2.0.ZU;2-H
Abstract
A method has been developed to measure the relative secondary ion yields of polymers. Parameters affecting secondary ion yield include primary ion cur rent, detector efficiency, mole concentrations of oligomers, and the extent of oligomer fragmentation. All of these factors are considered in the meas urement protocol. Two specific homopolymers were investigated: poly(dimethy lsiloxane) and poly(methylphenylsiloxane). The relative secondary ion yield s measured for PMPhS/PDMS were in the range of 0.29-0.35, depending on the polymer ratio. Transformation probabilities also were measured for the two polymers, and the PMPhS/PDMS ratio was 0.57. The results of the study indic ate that the pendant groups on the siloxane side chain have a significant e ffect on polymer ion yield and that measurement of relative ion yields for polymer mixtures represents a valid yield comparison.