A method has been developed to measure the relative secondary ion yields of
polymers. Parameters affecting secondary ion yield include primary ion cur
rent, detector efficiency, mole concentrations of oligomers, and the extent
of oligomer fragmentation. All of these factors are considered in the meas
urement protocol. Two specific homopolymers were investigated: poly(dimethy
lsiloxane) and poly(methylphenylsiloxane). The relative secondary ion yield
s measured for PMPhS/PDMS were in the range of 0.29-0.35, depending on the
polymer ratio. Transformation probabilities also were measured for the two
polymers, and the PMPhS/PDMS ratio was 0.57. The results of the study indic
ate that the pendant groups on the siloxane side chain have a significant e
ffect on polymer ion yield and that measurement of relative ion yields for
polymer mixtures represents a valid yield comparison.