Epitaxial growth of GaN thin films on sapphire (0001) by pulsed laser deposition: influence of surface preparation and nitridation

Citation
Jl. Deiss et al., Epitaxial growth of GaN thin films on sapphire (0001) by pulsed laser deposition: influence of surface preparation and nitridation, MAT SCI E B, 82(1-3), 2001, pp. 68-70
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107 → ACNP
Volume
82
Issue
1-3
Year of publication
2001
Pages
68 - 70
Database
ISI
SICI code
0921-5107(20010522)82:1-3<68:EGOGTF>2.0.ZU;2-Z
Abstract
Thin epilayers of GaN have been grown on Al2O3(0001) substrates using a pul sed laser deposition technique. The morphology and crystallinity of the GaN films deposited on pre-nitridated substrates have been controlled by AFM, RHEED and XRD. The purpose of this study was to get a better understanding of the nitridation procedure and of the initial growth stages in order to o btain a reproducible film quality. From these observations, it is seen that the hexagonal GaN epilayers are grown in a 3D mode on some monolayers of 2 D-cubic GaN, on top of cubic AIN formed by nitridation. (C) 2001 Elsevier S cience B.V. All rights reserved.