Hexagonal boron nitride thin films (h-BN) were deposited by microwave PECVD
on various substrates (silicon, quartz, glass...), and were analysed by in
frared, UV visible and microraman spectroscopies. The interpretation of the
IR spectra recorded at oblique incidence allowed us to determine the prefe
rential orientation of the c-axis of the h-BN films. The influence of the d
eposition conditions on the orientation is studied as a function of the pla
sma power. The optical constants in the infrared are also given by the Kram
ers-Kronig method. (C) 2001 Elsevier Science B.V. AII rights reserved.