We have studied the ground state of two-dimensional small-Josephson-junctio
n arrays fabricated by the electron-beam lithography. To control the streng
th of dissipation, we attach an Ohmic resistor (a Cr thin film) to each Al-
AlOx-Al junction. The I-V curve shows a transition from the insulating beha
vior with the Coulomb gap to the superconducting behavior with DC-Josephson
-like current as the shunt resistance decreases. The measured phase diagram
is compared with theories of the dissipative phase transition. (C) 2001 El
sevier Science B.V. All rights reserved.