In this Letter we present results of Monte Carlo simulation of a model of a
morphous Si using an efficient tight-binding technique which gives high qua
lity, reliable structure of amorphous Si. We present the structural and ele
ctronic properties of the model and study the nature of electronic states.
The electronic states near the band edges have been found to be localized u
sing participation numbers calculation. (C) 2001 Elsevier Science B.V. All
rights reserved.