Application of X-ray diffraction for studying initial stages of atomic ordering

Authors
Boyarshinova, TS Volkov, AY Shashkov, OD Turkhan, YE
Citation
Ts. Boyarshinova et al., Application of X-ray diffraction for studying initial stages of atomic ordering, PHYS MET R, 91(4), 2001, pp. 404-409
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science",Metallurgy
Journal title
PHYSICS OF METALS AND METALLOGRAPHY
ISSN journal
0031918X → ACNP
Volume
91
Issue
4
Year of publication
2001
Pages
404 - 409
Database
ISI
SICI code
0031-918X(200104)91:4<404:AOXDFS>2.0.ZU;2-Y
Abstract
It is shown that in alloys with the L1(0) superstructure the X-ray diffract ion method of measuring the degree of tetragonality c/a is inapplicable for estimating the extent of order at the initial stages of the process of ato mic ordering.