A time-of-flight secondary ion mass spectrometry study of sequential polymers with a well-defined segmental length

Citation
L. Li et al., A time-of-flight secondary ion mass spectrometry study of sequential polymers with a well-defined segmental length, POLYMER, 42(16), 2001, pp. 6841-6849
Citations number
30
Categorie Soggetti
Organic Chemistry/Polymer Science
Journal title
POLYMER
ISSN journal
00323861 → ACNP
Volume
42
Issue
16
Year of publication
2001
Pages
6841 - 6849
Database
ISI
SICI code
0032-3861(200107)42:16<6841:ATSIMS>2.0.ZU;2-5
Abstract
Two series of sequential polymers (6FBA-Cn and BA-Cn) have been synthesized by phase-transfer catalyzed polyetherification of 1,n-dibromoalkane (n = 4 , 6, 8, 10, 12, 14 and 18) with 4,4 '-(hexafluoroisopropylidene)diphenol (6 FBA) and bisphenol A (BA). The effects of the flexible aliphatic segment le ngth on the structure of secondary ions were investigated. The characterist ic secondary positive and negative ions in the time-of-flight secondary ion mass spectrometry (ToF-SIMS) spectra are related to the chemical structure s of the sequential BA-Cn and 6FBA-Cn polymers. The emission of the charact eristic secondary positive and negative ions occurs after cleavage of the C -O bonds of the polymer repeat units. In the ToF-SIMS negative spectra, a s eries of small peaks separated by 14 amu provides the information about the flexible segment lengths of the repeat units of the BA-Cn and 6FBA-Cn poly mers and can be used to directly determine the number of the -CH2- groups, n, of the flexible segment. (C) 2001 Elsevier Science Ltd. All rights reser ved.