Use of refractory compounds in microelectronics

Citation
La. Dvorina et As. Dranenko, Use of refractory compounds in microelectronics, POWD MET ME, 39(9-10), 2000, pp. 520-523
Citations number
12
Categorie Soggetti
Metallurgy
Journal title
POWDER METALLURGY AND METAL CERAMICS
ISSN journal
10681302 → ACNP
Volume
39
Issue
9-10
Year of publication
2000
Pages
520 - 523
Database
ISI
SICI code
1068-1302(200009/10)39:9-10<520:UORCIM>2.0.ZU;2-9
Abstract
This article surveys the literature on the use of high-melting compounds to form thin films. The uses of these materials are classified on the basis o f the following scheme: low-resistance connectors, ohmic contacts, Schottky barriers, electrooptic devices, magnetic materials, barrier layers. The se t of properties and main parameters of films are discussed, and the most pr omising areas for the use of films of high-melting compounds in microelectr onics are noted. The conditions are being created for the replacement of tr aditional metallic films by high-melting compounds.