Rotational mobility of equivalent to SiOC center dot X-2 radicals "grafted" to the activated surface of aerosil

Authors
Pergushov, VI
Citation
Vi. Pergushov, Rotational mobility of equivalent to SiOC center dot X-2 radicals "grafted" to the activated surface of aerosil, RUSS J PH C, 75(5), 2001, pp. 766-769
Citations number
16
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY
ISSN journal
00360244 → ACNP
Volume
75
Issue
5
Year of publication
2001
Pages
766 - 769
Database
ISI
SICI code
0036-0244(200105)75:5<766:RMOETS>2.0.ZU;2-5
Abstract
The rotational mobility times of "grafted" drop SiOC .X-2 radicals were det ermined in a wide temperature range, which made it possible to estimate the activation energies of motions that resulted in averaging of Zeeman and hy perfine interactions in radicals of this type at elevated temperatures.