Tj. Wess et al., The use of small-angle x-ray diffraction studies for the analysis of structural features in archaeological samples, ARCHAEOMETR, 43, 2001, pp. 117-129
X-ray diffraction or scattering analysis provides a powerful non-destructiv
e technique capable of providing important information about the state of a
rchaeological samples in the nanometer length scale. Small-angle diffractio
n facilities are usually found at synchrotron sources, although the potenti
al of a laboratory source is also described. Specific examples of analysis
using X-ray diffraction of historic parchment, archaeological bone, a Centr
al Mexico style pictograph and microdiffraction of calcified tissues are us
ed to show the scope and versatility of the technique. Diffraction data is
capable of giving fundamental structural information as well as quantifying
the remodelling of structures influenced by environmental fact ors.