XPS DETERMINATION OF THIN OVERLAYER THICK NESS

Authors
NEFEDOV VI FEDOROVA IS
Citation
Vi. Nefedov et Is. Fedorova, XPS DETERMINATION OF THIN OVERLAYER THICK NESS, Doklady Akademii nauk. Rossijskaa akademia nauk, 353(5), 1997, pp. 628-630
Citations number
8
Categorie Soggetti
Multidisciplinary Sciences
Journal title
Doklady Akademii nauk. Rossijskaa akademia nauk → ACNP
ISSN journal
08695652
Volume
353
Issue
5
Year of publication
1997
Pages
628 - 630
Database
ISI
SICI code
0869-5652(1997)353:5<628:XDOTOT>2.0.ZU;2-J