On diagnosis and diagnostic test generation for pattern-dependent transition faults

Citation
I. Pomeranz et Sm. Reddy, On diagnosis and diagnostic test generation for pattern-dependent transition faults, IEEE COMP A, 20(6), 2001, pp. 791-800
Citations number
16
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
ISSN journal
02780070 → ACNP
Volume
20
Issue
6
Year of publication
2001
Pages
791 - 800
Database
ISI
SICI code
0278-0070(200106)20:6<791:ODADTG>2.0.ZU;2-7
Abstract
We propose a method of modeling pattern dependence as part of the existing delay fault models without incurring the complexity of considering physical effects that cause pattern dependence. We apply the method to transition f aults. We define the conditions under which two pattern-dependent transitio n faults can be said to be distinguished by a given test set. We provide ex perimental results to demonstrate the diagnostic resolutions obtained under the proposed model. We also present conditions for identifying pairs of in distinguishable pattern-dependent transition faults and propose a procedure for generating diagnostic tests for distinguishable pattern-dependent tran sition faults.