Kossel lines in extremely asymmetric diffraction schemes

Citation
Am. Afanas'Ev et al., Kossel lines in extremely asymmetric diffraction schemes, JETP LETTER, 73(6), 2001, pp. 271-273
Citations number
11
Categorie Soggetti
Physics
Journal title
JETP LETTERS
ISSN journal
00213640 → ACNP
Volume
73
Issue
6
Year of publication
2001
Pages
271 - 273
Database
ISI
SICI code
0021-3640(2001)73:6<271:KLIEAD>2.0.ZU;2-4
Abstract
It is demonstrated theoretically that the intensity distribution within the Kossel lines in an extremely asymmetric X-ray diffraction scheme has an an omalous shape of a sharp peak exceeding the background intensity by several hundred times. The possibility of experimental observation of this phenome non is discussed. (C) 2001 MAIK "Nauka/ Interperiodica".