Atomic force microscopy studies of short melamine fiber reinforced EPDM rubber

Citation
Rs. Rajeev et al., Atomic force microscopy studies of short melamine fiber reinforced EPDM rubber, J MATER SCI, 36(11), 2001, pp. 2621-2632
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
36
Issue
11
Year of publication
2001
Pages
2621 - 2632
Database
ISI
SICI code
0022-2461(2001)36:11<2621:AFMSOS>2.0.ZU;2-A
Abstract
Atomic Force Microscopy (AFM) was used to investigate the morphology and in terfacial properties of unaged and aged Ethylene Propylene Diene (EPDM) rub ber-melamine fiber composites. Interfacial adhesion between the fiber and t he matrix was weak in the absence of a dry bonding system consisting of hex amethylene tetramine, resorcinol and hydrated silica (HRH). AFM images reve aled the formation of an interface between the fiber and the matrix with th e addition of the bonding agents. Ageing of the composites improved the adh esion between the fiber and the matrix, which was evident from the topograp hic images of the aged composites. It was found that two-dimensional and th ree-dimensional topographic images from AFM could be used to determine fibe r geometry, fiber diameter and fiber-matrix adhesion in short fiber-rubber composites. (C) 2001 Kluwer Academic Publishers.