Probe microscopes for studying nanostructures on a surface (Hanover Fair 2000 and High-Tech and Investment 2000 Exhibit)

Authors
Voronin, YM
Citation
Ym. Voronin, Probe microscopes for studying nanostructures on a surface (Hanover Fair 2000 and High-Tech and Investment 2000 Exhibit), J OPT TECH, 68(5), 2001, pp. 365-367
Citations number
7
Categorie Soggetti
Optics & Acoustics
Journal title
JOURNAL OF OPTICAL TECHNOLOGY
ISSN journal
10709762 → ACNP
Volume
68
Issue
5
Year of publication
2001
Pages
365 - 367
Database
ISI
SICI code
1070-9762(200105)68:5<365:PMFSNO>2.0.ZU;2-B
Abstract
This paper discusses the construction principles and the technical and oper ational features of atomic-force, near-field, and other nanoprobe devices d emonstrated at the international exhibits of various firms in 2000. (C) 200 1 The Optical Society. of America.