Optimization of second-harmonic generation microscopy

Citation
R. Gauderon et al., Optimization of second-harmonic generation microscopy, MICRON, 32(7), 2001, pp. 691-700
Citations number
39
Categorie Soggetti
Multidisciplinary
Journal title
MICRON
ISSN journal
09684328 → ACNP
Volume
32
Issue
7
Year of publication
2001
Pages
691 - 700
Database
ISI
SICI code
0968-4328(200110)32:7<691:OOSGM>2.0.ZU;2-P
Abstract
We describe the principles and characteristics of second-harmonic generatio n imaging (SHGI) and explore various methods for optimization of the techni que. Second-harmonic imaging is optimized for ultrashort laser pulses, high numerical aperture microscope objectives, a highly sensitive non-descanned large area detector, pseudo-phase-matching, and specimens with large secon d-order non linearity or which exhibit surface plasmon enhanced phenomena. We also compare and contrast the techniques of SHGI and two-photon excited fluorescence imaging. (C) 2001 Elsevier Science Ltd. All rights reserved.