Measurement of thin coatings in the confocal microscope

Authors
Cox, G Sheppard, CJR
Citation
G. Cox et Cjr. Sheppard, Measurement of thin coatings in the confocal microscope, MICRON, 32(7), 2001, pp. 701-705
Citations number
13
Categorie Soggetti
Multidisciplinary
Journal title
MICRON
ISSN journal
09684328 → ACNP
Volume
32
Issue
7
Year of publication
2001
Pages
701 - 705
Database
ISI
SICI code
0968-4328(200110)32:7<701:MOTCIT>2.0.ZU;2-G
Abstract
The use of the confocal microscope for measurement of the thickness of thin transparent coatings, such as the varnish layer on compact discs, is descr ibed. The relationship between true and apparent thickness varies in a non- linear fashion, but intensity profiles show a good correspondence with calc ulated profiles. This provides the basis of a nomogram for prediction of co ating thickness. (C) 2001 Published by Elsevier Science Ltd.