Does the diffusion mechanism in thin amorphous Co81Zr19 films change during structural relaxation?

Citation
A. Heesemann et al., Does the diffusion mechanism in thin amorphous Co81Zr19 films change during structural relaxation?, NEW J PHYS, 3, 2001, pp. 61-67
Citations number
31
Categorie Soggetti
Physics
Journal title
NEW JOURNAL OF PHYSICS
ISSN journal
13672630 → ACNP
Volume
3
Year of publication
2001
Pages
61 - 67
Database
ISI
SICI code
1367-2630(20010517)3:<61:DTDMIT>2.0.ZU;2-G
Abstract
In order to clarify the diffusion mechanisms in metallic glasses we measure d the time dependence and the isotope effect E = (D-alpha/D-beta - 1)/(root m(beta)/m(alpha)-1) of Co diffusion in thin 1 mum amorphous Co81Zr19 films during structural relaxation. To observe diffusion on a nanometre scale the radiotracer technique in conjunction with serial sectioning in conjunction with ion-beam sputtering was employed. A drop of the diffusivity by a fact or of three was found during structural relaxation at T = 573 K, but no cha nge in E was observed. Small isotope effects of E = 0.00(2) in the relaxed and even in the as-quenched states in the present alloy strongly suggest co llective hopping diffusion mechanisms in the relaxed as well as in the as-q uenched states. These results are in good accordance with results in thin 1 mum amorphous Co51Zr49 films. The results are compared to measurements in melt-spun amorphous Co76.7Fe2Nb14.3B7, where a drastic drop of E during rel axation has been observed. We further discuss the results with respect to m easurements in melt-spun Co89Zr11 ribbons to clarify the mechanism of annea ling defects. The absence of any geometry effect seems to rule out annihila tion of quenched-in free volume at the outer surface in thin Co-Zr glasses.