The thickness dependence of dielectric response of semicontinuous gold film
s evaporated onto glass substrates under various temperatures has been stud
ied. A wide range of mass thicknesses (and filling factors) was considered,
up to those corresponding to continuous films. The work includes a brief i
ntroduction, description of sample preparation and transmittance measuremen
ts, as well as determination of the dielectric response function using simp
le phenomenological model, namely, the generalized Bruggeman approximation.
The approximation considers system's dimension as a varied noninteger quan
tity near the percolation threshold where the correlation length is large.
The results obtained show that our model is valid in the actual range and d
ielectric properties of films are related to their morphological peculiarit
ies. So, we refine and supplement some of our results reported in an earlie
r work (Proc. SPIE 3133 (1997) 300). (C) 2001 Elsevier Science B.V. All rig
hts reserved.