Electrical transport studies of Ag nanoclusters embedded in glass matrix

Silver nanoclusters embedded in glass matrices have been obtained by the co mbined use of ion exchange and subsequent ion implantation. XRD and UV-visi ble spectro-photometric analysis have confirmed the formation of Ag nano-cl usters in the ion-irradiated samples. Temperature-dependent resistivity mea surements of the irradiated samples have been found to follow rho (T) propo rtional to exp root (T-0/T) in the temperature range of 80-280 K. The obser ved behaviour of p(T) is consistent with charge transport due to hopping be tween isolated, conducting islands. The separation distance between the con ducting islands has been found to be a function of fluence. (C) 2001 Elsevi er Science B.V. All rights reserved.